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841 to 850 of 6,872 Results

Replication Data for: "Fractional charging of electronically open molecules: An explicit projection operator approach" Mar 7, 2025 Sannes, Bendik Støa; Pedersen, Jacob; Høyvik, Ida-Marie, 2025, "Replication Data for: "Fractional charging of electronically open molecules: An explicit projection operator approach"", https://doi.org/10.18710/6DX8IK, DataverseNO, V2 This data set is supplementary to the article "Fractional charging of electronically open molecules: An explicit projection operator aproach" (J. Chem. Phys. 162, 094108 (2025). doi: https://doi.org/10.1063/5.0251855). This data set contains the geometry file (.xyz), input (.inp)...
00_README.txt Mar 7, 2025 - Replication Data for: "Fractional charging of electronically open molecules: An explicit projection operator approach" Plain Text - 4.5 KB - MD5: 68667bf6796964d9e2884f7dcb829f76 Readme file
Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables Mar 3, 2025 Gerhard, Silas Merlin; Mauseth, Frank; Hestad, Øystein; Doedens, Espen; Jarvid, Markus, 2025, "Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables", https://doi.org/10.18710/GNFRHZ, DataverseNO, V1 This dataset is considered an add-on to a conference paper that has not been published yet. The information in the paper are in part crucial to understand the dataset. The dataset contains raw data, processed data and additional diagrams to the study described in the paper.
00_README.txt Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables Plain Text - 5.0 KB - MD5: 882f71987141f38233fa1a9184815127
alpha_lit.pdf Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables Adobe PDF - 10.1 KB - MD5: 343aea5722504292b1d65a5e0fd6b80f
alpha_lit.png Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables PNG Image - 52.0 KB - MD5: 4d882a1325fa7d2740a87a34e034e04b
alpha_lit.svg Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables SVG Image - 135.8 KB - MD5: a9ec1b8ad4fd3be14daedb19f9a21eff
alpha.pdf Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables Adobe PDF - 9.2 KB - MD5: 10b342e4651ce7b1832d126273da5456
alpha.png Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables PNG Image - 45.4 KB - MD5: 2f4fd4fd9242d3db12fae459df5c0909
alpha.svg Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables SVG Image - 114.5 KB - MD5: 43f517398f70c9173730a44cd84b1ffd

Replication Data for: "Fractional charging of electronically open molecules: An explicit projection operator approach"

Mar 7, 2025

Sannes, Bendik Støa; Pedersen, Jacob; Høyvik, Ida-Marie, 2025, "Replication Data for: "Fractional charging of electronically open molecules: An explicit projection operator approach"", https://doi.org/10.18710/6DX8IK, DataverseNO, V2

This data set is supplementary to the article "Fractional charging of electronically open molecules: An explicit projection operator aproach" (J. Chem. Phys. 162, 094108 (2025). doi: https://doi.org/10.1063/5.0251855). This data set contains the geometry file (.xyz), input (.inp)...

00_README.txt

Mar 7, 2025 - Replication Data for: "Fractional charging of electronically open molecules: An explicit projection operator approach"

Plain Text - 4.5 KB -

Readme file

Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables

Mar 3, 2025

Gerhard, Silas Merlin; Mauseth, Frank; Hestad, Øystein; Doedens, Espen; Jarvid, Markus, 2025, "Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables", https://doi.org/10.18710/GNFRHZ, DataverseNO, V1

This dataset is considered an add-on to a conference paper that has not been published yet. The information in the paper are in part crucial to understand the dataset. The dataset contains raw data, processed data and additional diagrams to the study described in the paper.

00_README.txt

Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables

Plain Text - 5.0 KB -

alpha_lit.pdf

Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables

Adobe PDF - 10.1 KB -

alpha_lit.png

Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables

PNG Image - 52.0 KB -

alpha_lit.svg

Mar 3, 2025 - Data for: Lifetime Estimation based on HVDC Breakdown Strength of Thin Films Peeled from Fresh and PQ-Tested 525 kV DC-XLPE Cables

SVG Image - 135.8 KB -